| Author | R. Dean Adams |
| Format | Hardcover |
| ISBN | 9781402072550 |
| Publisher | Kluwer Academic Publishers |
| Manufacturer | Kluwer Academic Publishers |
Catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers working on chips do not do their jobs very carefully. Due to the inter-relatedness of the two areas, this book considers design and test jointly.
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