| Author | Nicola Nicolici , Bashir M. Al-Hashimi , Bashir Al-Hashimi |
| Format | Hardcover |
| ISBN | 9781402072352 |
| Publication Date | 17/05/2009 |
| Publisher | Kluwer Academic Publishers |
| Manufacturer | Kluwer Academic Publishers Group |
Focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. This book surveys the techniques for power constrained testing of VLSI circuits. It gives test automation techniques for reducing power in scan-based sequential circuits and BIST data paths.
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