Testing Static Random Access Memories: Defects, Fault Models and Test Patterns Frontiers in Electronic Testing

Name: Testing Static Random Access Memories: Defects, Fault Models and Test Patterns Frontiers in Electronic Testing
Brand: Kluwer Academic Publishers Group
SKU: 19325027
Price: 2779.00 ZAR
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Covers testing of one of the important semiconductor memories types. This book addresses testing of static random access memories (SRAMs), both single-port and multi-port. It introduces description of realistic fault models, based on defect injection and SPICE simulation.

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Features

Author	Said Hamdioui
Format	Hardcover
ISBN	9781402077524
Publication Date	17/05/2009
Publisher	Springer-Verlag New York Inc.
Manufacturer	Kluwer Academic Publishers Group

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