| Author | Jon Orloff , Lynwood Swanson , Mark Utlaut |
| Format | Hardcover |
| ISBN | 9780306473500 |
| Publisher | Plenum Publishing Co.,N.Y. |
| Manufacturer | Plenum Publishing Co.,n.y. |
The authors have attempted in this book, to produce a reference on high resolution focused ion beams (FIBs) that should be useful for both the user and the designer of FIB instrumentation. They have included a mix of theory and applications.
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