| Author | C. Suryanarayana , M. G. Norton |
| Format | Hardcover |
| ISBN | 9780306457449 |
| Publisher | Plenum Publishing Co.,N.Y. |
| Manufacturer | Plenum Publishing Co.,n.y. |
Explores a range of diffraction techniques in the field of materials characterization used to obtain information on an atomic scale from both crystalline and noncrystalline (amorphous) materials. The analysis of and extraction of information from diffraction patterns are stressed over theoretical considerations. After an introductory section on suc
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