| Author | David B. Williams |
| Format | Hardcover |
| ISBN | 9780306448584 |
| Publisher | Kluwer Academic/Plenum Publishers |
| Manufacturer | Kluwer Academic/plenum Publishers |
'[A] rich and authoritative collection of papers, which have both a historical and an up-to-the-minute dimension.'--from the Foreword by Peter Duncumb, University of Cambridge, England ''Contains a vast amount of detailed information and will surely be heavily used.'' --Ultramicroscopy This volume reviews current research in the field of X-ray spectrometry and its relationship to the practice of electron probe X-ray microanalysis.
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