VLSI Test Principles and Architectures: Design for Testability Systems on Silicon

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This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testabili... Read more

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Features

Author	Laung-terng Wang, Cheng-Wen Wu, Xiaoqing Wen
Format	Hardcover
ISBN	9780123705976
Publication Date	14/08/2006
Publisher	Morgan Kaufmann Publishers

Description

Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures. Lecture slides and exercise solutions for all chapters are now available. Instructors are also eligible for downloading PPT slide files and MSWORD solutions files from the manual website.

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