| Author | Kenneth E. Goodson , Y. Sungtaek Ju , Y. Sungtaek Ju |
| Format | Hardcover |
| ISBN | 9780792385912 |
| Publication Date | 20/05/2007 |
| Publisher | Kluwer Academic Publishers Group |
| Manufacturer | Kluwer Academic Publishers Group |
This book discusses experimental and theoretical studies of heat transfer in transistors and interconnects. Also reported are techniques for determining the thermal transport properties of dielectric passivation layers and ultra-thin silicon-on-insulator (SOI) layers.
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